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[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - 3D thermal modeling based on the two-port network theory for hybrid or monolithic integrated power circuits
Dorkel, J.-M., Tounsi, P., Leturcq, P.Year:
1996
Language:
english
DOI:
10.1109/stherm.1996.545096
File:
PDF, 632 KB
english, 1996