![](/img/cover-not-exists.png)
[IEEE 2001 IEEE Industry Applications Society 36th Annual Meeting - IAS'01 - Chicago, IL, USA (30 Sept.-4 Oct. 2001)] Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248) - Early detection of weak points in MEEC distribution system
Abdel-Salam, M., Abdel-Sattar, S., Sayed, Y., Ghally, M.Volume:
4
Year:
2001
Language:
english
DOI:
10.1109/ias.2001.955978
File:
PDF, 788 KB
english, 2001