[IEEE 2010 International Conference on High Voltage Engineering and Application (ICHVE) - New Orleans, LA, USA (2010.10.11-2010.10.14)] 2010 International Conference on High Voltage Engineering and Application - Investigation of PD occurrence and detectability in high voltage power cable accessories
Cichecki, Piotr, Stewayan, Jarot, Gulski, Edward, Smit, Johan J., Chmura, LukaszYear:
2010
Language:
english
DOI:
10.1109/ichve.2010.5640813
File:
PDF, 659 KB
english, 2010