[IEEE Comput. Soc 10th IEEE International On-Line Testing...

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[IEEE Comput. Soc 10th IEEE International On-Line Testing Symposium - Funchal, Madeira Island, Portugal (12-14 July 2004)] Proceedings. 10th IEEE International On-Line Testing Symposium - Survey of the algorithms in the column-matching BIST method

Fiser, P., Kubatova, H.
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Year:
2004
Language:
english
DOI:
10.1109/olt.2004.1319683
File:
PDF, 215 KB
english, 2004
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