[IEEE 2012 13th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2012.03.19-2012.03.21)] Thirteenth International Symposium on Quality Electronic Design (ISQED) - Thermal analysis of 3D integrated circuits based on discontinuous Galerkin finite element method
Zjajo, Amir, van der Meijs, Nick, van Leuken, ReneYear:
2012
Language:
english
DOI:
10.1109/isqed.2012.6187483
File:
PDF, 297 KB
english, 2012