[IEEE 2009 Design, Automation & Test in Europe...

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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - FSAF: File system aware flash translation layer for NAND Flash Memories

Mylavarapu, S.K., Choudhuri, S., Shrivastava, A., Jongeun Lee,, Givargis, T.
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Year:
2009
Language:
english
DOI:
10.1109/date.2009.5090696
File:
PDF, 332 KB
english, 2009
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