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[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Interplay between statistical reliability and variability: A comprehensive transistor-to-circuit simulation technology
Gerrer, L., Amoroso, S. M., Asenov, P., Ding, J., Cheng, B., Adamu-Lema, F., Markov, S., Asenov, A., Reid, D., Millar, C., Asenov, A.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6531972
File:
PDF, 1.68 MB
english, 2013