[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - Hot carrier degradation of HV-SOI devices under off-and on-state current conditions
van Dalen, R., Dhar, S., Heringa, A., Swanenberg, M. J., van der Wal, A. B., Boos, P. W. M., Braspenning-Girault, V.Year:
2011
Language:
english
DOI:
10.1109/ispsd.2011.5890862
File:
PDF, 447 KB
english, 2011