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Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope
Yoshiaki Yasuno, Tobias F Wiesendanger, Aiko K Ruprecht, Shuichi Makita, Toyohiko Yatagai, Hans J TizianiVolume:
232
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.optcom.2003.12.057
File:
PDF, 332 KB
english, 2004