Wavefront-flatness evaluation by...

Wavefront-flatness evaluation by wavefront-correlation-information-entropy method and its application for adaptive confocal microscope

Yoshiaki Yasuno, Tobias F Wiesendanger, Aiko K Ruprecht, Shuichi Makita, Toyohiko Yatagai, Hans J Tiziani
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
232
Year:
2004
Language:
english
Pages:
7
DOI:
10.1016/j.optcom.2003.12.057
File:
PDF, 332 KB
english, 2004
Conversion to is in progress
Conversion to is failed