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[IEEE 2006 IEEE Instrumentation and Measurement Technology - Sorrento, Italy (2006.04.24-2006.04.27)] 2006 IEEE Instrumentation and Measurement Technology Conference Proceedings - An Emulation Technique for Diagnosis and Failure Analysis of ATE
Hashempour, Hamidreza, Lombardi, Fabrizio, Mehta, Rakesh, Alton, Timothy, Necoechea, WarrenYear:
2006
Language:
english
DOI:
10.1109/imtc.2006.328291
File:
PDF, 83 KB
english, 2006