Measurement of thin film thickness by electronic speckle...

Measurement of thin film thickness by electronic speckle pattern interferometry

Canan Karaaliog̃lu, Yani Skarlatos
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Volume:
234
Year:
2004
Language:
english
Pages:
8
DOI:
10.1016/j.optcom.2004.02.025
File:
PDF, 362 KB
english, 2004
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