[IEEE 2008 IEEE International Reliability Physics Symposium...

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[IEEE 2008 IEEE International Reliability Physics Symposium (IRPS) - Phoenix, AZ, USA (2008.04.27-2008.05.1)] 2008 IEEE International Reliability Physics Symposium - Negative bias temperature instability on Si-passivated Ge-interface

Aoulaiche, M., Kaczer, B., De Jaeger, B., Houssa, M., Martens, K., Degraeve, R., Roussel, P., Mitard, J., De Gendt, S., Maes, H.E., Groeseneken, G., Meuris, M., Heyns, M.M.
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Year:
2008
Language:
english
DOI:
10.1109/RELPHY.2008.4558912
File:
PDF, 223 KB
english, 2008
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