Quantitative tomographic X-ray profiling of non-Bragg diffracting materials using phase retrieval X-ray diffractometry
A.Y. Nikulin, R.B. Horney, A.V. Darahanau, I.D. Svalbe, T. Bigault, E. ZieglerVolume:
235
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.optcom.2004.03.011
File:
PDF, 254 KB
english, 2004