[IEEE 2006 IEEE/ACM International Conference on Computer Aided Design - Double Tree Hotel, San Jose, CA,USA (2006.11.5-2006.11.9)] 2006 IEEE/ACM International Conference on Computer Aided Design - Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN Transceivers
Acar, Erkan, Ozev, Sule, Redmond, KevinYear:
2006
Language:
english
DOI:
10.1109/iccad.2006.320138
File:
PDF, 9.19 MB
english, 2006