[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - A 6.4Gbps on-chip eye opening monitor circuit for signal integrity analysis of high speed channel
Minchul Shin,, Jongjoo Shim,, Jaemin Kim,, Jun So Pak,, Chulsoon Hwang,, Changwook Yoon,, Joungho Kim,, Hyungsoo Kim,, Kunwoo Park,, Yongju Kim,Year:
2008
Language:
english
DOI:
10.1109/isemc.2008.4652099
File:
PDF, 707 KB
english, 2008