[IEEE 2006 IEEE Radiation Effects Data Workshop - Ponte Vedra Beach, FL, USA (2006.07.17-2006.07.21)] 2006 IEEE Radiation Effects Data Workshop - Total Ionizing Dose Testing of a RadHard-by-Design FET Driver in a 0.35¿m Triple-Well Process
Hartwell, Mary, Ryan, Kevin, Netherton, Steve, Milliken, Peter, Kerwin, DavidYear:
2006
Language:
english
DOI:
10.1109/redw.2006.295474
File:
PDF, 5.56 MB
english, 2006