A measurement system for determining the thickness of an...

Optics Communications 2005 Vol. 253; Iss. 1-3

A measurement system for determining the thickness of an optical wave plate

Ming-Jyi Jang, Chih-Feng Lu
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Volume:
253
Year:
2005
Language:
english
Pages:
8
DOI:
10.1016/j.optcom.2005.04.038
File:
PDF, 221 KB
english, 2005
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