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[IEEE 2007 IEEE Symposium on VLSI Technology - Kyoto, Japan (2007.06.12-2007.06.14)] 2007 IEEE Symposium on VLSI Technology - Stress dependence and poly-pitch scaling characteristics of (110) PMOS drive current
Yang, B., Nummy, K., Waite, A., Black, L., Gossmann, H., Yin, H., Liu, Y., Kim, B., Narasimha, S., Fisher, P., Meer, H. V., Johnson, J., Chidambarrao, D., Kim, S.D., Sheraw, C., Wehella-gamage, D., HoYear:
2007
Language:
english
DOI:
10.1109/vlsit.2007.4339753
File:
PDF, 541 KB
english, 2007