Gate-bias stress-dependent photoconductive characteristics of multi-layer MoS 2 field-effect transistors
Cho, Kyungjune, Kim, Tae-Young, Park, Woanseo, Park, Juhun, Kim, Dongku, Jang, Jingon, Jeong, Hyunhak, Hong, Seunghun, Lee, TakheeVolume:
25
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/25/15/155201
Date:
April, 2014
File:
PDF, 1.83 MB
english, 2014