[IEEE 2008 17th Biennial University/Government/Industry Micro/Nano Symposium - Louisville, KY, USA (2008.07.13-2008.07.16)] 2008 17th Biennial University/Government/Industry Micro/Nano Symposium - Sorbent Coatings and Processing Techniques for Trace Analysis of Hazardous Materials in Micro/Nano Sensors
Pai, R. S., McGill, R. A., Simonson, D. L., Higgins, B. A., Houser, E. J., Papantonakis, M. R., Nguyen, V., Stepnowski, S. V., Stievater, T. H., Rabinovitch, W. S., Papanicolau, N. A., Bass, R., StepnYear:
2008
Language:
english
DOI:
10.1109/ugim.2008.47
File:
PDF, 231 KB
english, 2008