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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - A high-endurance (≫100K) BE-SONOS NAND flash with a robust nitrided tunnel oxide/si interface
Wang, Szu-Yu, Lue, Hang-Ting, Hsu, Tzu-Hsuan, Du, Pei-Ying, Lai, Sheng-Chih, Hsiao, Yi-Hsuan, Hong, Shih-Ping, Wu, Ming-Tsung, Hsu, Fang-Hao, Lian, Nan-Tzu, Lu, Chi-Pin, Hsieh, Jung-Yu, Yang, Ling-Wu,Year:
2010
Language:
english
DOI:
10.1109/irps.2010.5488698
File:
PDF, 439 KB
english, 2010