[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai,...

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[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - High Performance Compaction for Test Responses with Many Unknowns

Rabenalt, Thomas, Richter, Michael, Goessel, Michael
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Year:
2010
DOI:
10.1109/ats.2010.40
File:
PDF, 349 KB
2010
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