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[IEEE 2011 78th ARFTG Microwave Measurement Conference - Tempe, AZ, USA (2011.12.1-2011.12.2)] 78th ARFTG Microwave Measurement Conference - 3D Modeling of assembly influence on packaged transistors
Moravek, Ondrej, Hoffmann, KarelYear:
2011
Language:
english
DOI:
10.1109/arftg78.2011.6183866
File:
PDF, 1.78 MB
english, 2011