[IEEE IEEE MTT-S International Microwave Symposium - IMS...

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[IEEE IEEE MTT-S International Microwave Symposium - IMS 2003 - Philadelphia, PA, USA (8-13 June 2003)] IEEE MTT-S International Microwave Symposium Digest, 2003 - Characterization of a microwave probe up to frequencies of 400 GHz

Bieler, M., Spitzer, M., Hein, G., Siegner, U.
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Volume:
3
Year:
2003
Language:
english
DOI:
10.1109/mwsym.2003.1210492
File:
PDF, 282 KB
english, 2003
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