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[IEEE 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ipoh, Perak, Malaysia (2012.11.6-2012.11.8)] 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - An investigation on Cu wire bond corrosion and mitigation technique for automotive reliability
Tai, C.T., Lim, H.Y., Teo, C.H., Audrey Swee, P.J.Year:
2012
Language:
english
DOI:
10.1109/iemt.2012.6521745
File:
PDF, 2.23 MB
english, 2012