![](/img/cover-not-exists.png)
[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - A Digital BIST for Phase-Locked Loops
Sliech, Kevin, Margala, MartinYear:
2008
Language:
english
DOI:
10.1109/dft.2008.62
File:
PDF, 380 KB
english, 2008