Reducing measurement uncertainty in a DSP-based...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2005 / 07 Vol. 13; Iss. 7

Reducing measurement uncertainty in a DSP-based mixed-signal test environment without increasing test time

Taillefer, C.S., Roberts, G.W.
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Volume:
13
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2005.850113
Date:
July, 2005
File:
PDF, 934 KB
english, 2005
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