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[IEEE 26th Annual Proceedings Reliability Physics Symposium 1988 - Monterey, CA, USA (12-14 April 1988)] 26th Annual Proceedings Reliability Physics Symposium 1988 - Reliability of discrete MODFETs: life testing, radiation effects, and ESD
Anderson, W.T., Christou, A., Buot, F.A., Archer, J., Bechtel, G., Cooke, H., Pao, Y.C., Simons, M., Chase, E.W.Year:
1988
Language:
english
DOI:
10.1109/relphy.1988.23433
File:
PDF, 623 KB
english, 1988