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[IEEE 2013 5th IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2013.05.26-2013.05.29)] 2013 5th IEEE International Memory Workshop - A novel multilayer Inter-Gate Dielectric enabling up to 18V Program / Erase window for planar NAND flash
Breuil, L., Lisoni, J., Blomme, P., Van den bosch, G., Van Houdt, J.Year:
2013
Language:
english
DOI:
10.1109/IMW.2013.6582100
File:
PDF, 602 KB
english, 2013