[IEEE EM2010) - Xiamen, China (2010.10.29-2010.10.31)] 2010...

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[IEEE EM2010) - Xiamen, China (2010.10.29-2010.10.31)] 2010 IEEE 17Th International Conference on Industrial Engineering and Engineering Management - Optimization of step stress accelerated degradation test plans

Zhang, Jing-Rui, Jiang, Tong-Min, Li, Xiao-Yang, Wang, Li-Zhi
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Year:
2010
Language:
english
DOI:
10.1109/ICIEEM.2010.5646470
File:
PDF, 1.17 MB
english, 2010
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