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[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - HfO2 inter-poly dielectric characteristics with interface fluorine passivation

Yung-Yu Chen,, Chih-Ren Hsieh,, Kwung-Wen Lu,, Jen-Chung Lou,
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Year:
2009
Language:
english
DOI:
10.1109/edssc.2009.5394289
File:
PDF, 2.03 MB
english, 2009
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