[IEEE 58th DRC. Device Research Conference - Denver, CO, USA (19-21 June 2000)] 58th DRC. Device Research Conference. Conference Digest (Cat. No.00TH8526) - Reliability and modeling of GaN-based light emitting diode
Hyunsoo Kim,, Ji-Myon Lee,, Chul Huh,, Sang-Woo Kim,, Dong-Joon Kim,, Seong-Ju Park,, Hyunsang Hwang,Year:
2000
Language:
english
DOI:
10.1109/drc.2000.877095
File:
PDF, 130 KB
english, 2000