![](/img/cover-not-exists.png)
[IEEE 2010 2nd International Conference on Information Science and Engineering (ICISE) - Hangzhou, China (2010.12.4-2010.12.6)] The 2nd International Conference on Information Science and Engineering - Strip steel surface defect image mosaic method based on area CCD
Yu-lan Wei,, Yun-hui Yan,, Jia-qi Zhang,, Bing Li,Year:
2010
Language:
english
DOI:
10.1109/icise.2010.5689635
File:
PDF, 1.26 MB
english, 2010