[IEEE 2012 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2012.12.10-2012.12.13)] 2012 International Electron Devices Meeting - Integrated gate-protected HEMTs and mixed-signal functional blocks for GaN smart power ICs
Kwan, Alex Man Ho, Liu, Xiaosen, Chen, Kevin J.Year:
2012
Language:
english
DOI:
10.1109/iedm.2012.6478997
File:
PDF, 511 KB
english, 2012