RF Characterization of Vertical InAs Nanowire Wrap-Gate...

IEEE Transactions on Microwave Theory and Techniques 2011 / 10 Vol. 59; Iss. 10

RF Characterization of Vertical InAs Nanowire Wrap-Gate Transistors Integrated on Si Substrates

Johansson, Sofia, Egard, Mikael, Ghalamestani, Sepideh Gorji, Borg, B. Mattias, Berg, Martin, Wernersson, Lars-Erik, Lind, Erik
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Volume:
59
Language:
english
Journal:
IEEE Transactions on Microwave Theory and Techniques
DOI:
10.1109/tmtt.2011.2163076
Date:
October, 2011
File:
PDF, 620 KB
english, 2011
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