[IEEE 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - Leicester, UK (10-13 July 1995)] Proceedings of 1995 IEEE 5th International Conference on Conduction and Breakdown in Solid Dielectrics - A study on the partial discharge characteristics according to the distribution pattern of voids within an insulation
Seung-Ik Jeon,, Doe-Sung Shin,, Do-Hong Yun,, Key-Man Han,, Min-Koo Han,Year:
1995
Language:
english
DOI:
10.1109/icsd.1995.523016
File:
PDF, 251 KB
english, 1995