[IEEE 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP) - Guilin, Guangxi, China (2012.08.13-2012.08.16)] 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging - Dissolution behavior of Cu UBM in BGA structure Sn-3.0Ag-0.5Cu/Cu joints during liquid isothermal aging at and above the solder's melting temperature
Zhou, Min-Bo, Zeng, Jing-Bo, Ma, Xiao, Zhang, Xin-PingYear:
2012
Language:
english
DOI:
10.1109/icept-hdp.2012.6474749
File:
PDF, 1.15 MB
english, 2012