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[IEEE 2012 International Conference on Advanced Semiconductor Devices & Microsystems (ASDAM) - Smolenice, Slovakia (2012.11.11-2012.11.15)] The Ninth International Conference on Advanced Semiconductor Devices and Mircosystems - Surface barrier 4H-SiC soft X-ray detecor for hot plasmas diagnostic
Dubecky, F., Gombia, E., Vanko, G., Ferrari, C., Zat'ko, B., Kovac, P., Bacek, D., Baldini, M., Ryc, L., Necas, V.Year:
2012
Language:
english
DOI:
10.1109/asdam.2012.6418521
File:
PDF, 235 KB
english, 2012