[IEEE ASDAM '98. Conference Proceedings. Second International Conference on Advances Semiconductor Devices and Microsystems - Smolenice Castle, Slovakia (5-7 Oct. 1998)] ASDAM '98. Conference Proceedings. Second International Conference on Advanced Semiconductor Devices and Microsystems (Cat. No.98EX172) - Study of bimetallic effect in a GaAs cantilever beam of power sensor microsystem
Lalinsky, T., Drzik, M., Hascik, S., Mozolova, I., Kuzmik, J., Hatzopoulos, Z.Year:
1998
Language:
english
DOI:
10.1109/asdam.1998.730228
File:
PDF, 313 KB
english, 1998