An Effective Approach of Reducing the Keep-Out-Zone Induced...

IEEE Transactions on Electron Devices 2014 / 8 Vol. 61; Iss. 8

An Effective Approach of Reducing the Keep-Out-Zone Induced by Coaxial Through-Silicon-Via

Fengjuan Wang,, Zhangming Zhu,, Yintang Yang,, Xiangkun Yin,, Xiaoxian Liu,, Ruixue Ding,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
61
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2014.2330838
Date:
August, 2014
File:
PDF, 1.95 MB
english, 2014
Conversion to is in progress
Conversion to is failed