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Back-gate bias enhanced band-to-band tunneling leakage in scaled MOSFET's
Ming-Jer Chen,, Huan-Tsung Huang,, Chin-Shan Hou,, Kuo-Nan Yang,Volume:
19
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.663538
Date:
April, 1998
File:
PDF, 88 KB
english, 1998