Back-gate bias enhanced band-to-band tunneling leakage in...

IEEE Electron Device Letters 1998 / 04 Vol. 19; Iss. 4

Back-gate bias enhanced band-to-band tunneling leakage in scaled MOSFET's

Ming-Jer Chen,, Huan-Tsung Huang,, Chin-Shan Hou,, Kuo-Nan Yang,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
19
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/55.663538
Date:
April, 1998
File:
PDF, 88 KB
english, 1998
Conversion to is in progress
Conversion to is failed