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[IEEE 2010 75th ARFTG Microwave Measurement Conference - Anaheim, CA, USA (2010.05.28-2010.05.28)] 75th ARFTG Microwave Measurement Conference - Comparison of noise figure calibration and measurement techniques using noise figure verification techniques
Shoulders, Bob, Wong, KenYear:
2010
Language:
english
DOI:
10.1109/arftg.2010.5496323
File:
PDF, 2.61 MB
english, 2010