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[IEEE [1992] 4th International Conference on Conduction and Breakdown in Solid Dielectrics - Sestri Levante, Italy (22-25 June 1992)] [1992] Proceedings of the 4th International Conference on Conduction and Breakdown in Solid Dielectrics - mu -PIXE analysis of impurity migration in polyethylene
Houdayer, A.J., Hinrichsen, P.F., Kajrys, G., Parpal, J.L., Fourmigue, J.M., Crine, J.P.Year:
1992
Language:
english
DOI:
10.1109/ICSD.1992.225006
File:
PDF, 353 KB
english, 1992