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[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - A Unified Interconnects Testing Scheme for 3D Integrated Circuits
Pai, Chih-Yun, Cu, Ruei-Ting, Cheng, Bo-Chuan, Chen, Liang-Bi, Li, Katherine Shu-MinYear:
2011
Language:
english
DOI:
10.1109/ats.2011.38
File:
PDF, 516 KB
english, 2011