[IEEE 2004 IEEE International Symposium on Circuits and Systems - Vancouver, BC, Canada (23-26 May 2004)] 2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) - Test vector generation and classification using FSM traversals
Marczynski, R., Thornton, M.A., Szygenda, S.A.Year:
2004
Language:
english
DOI:
10.1109/iscas.2004.1329524
File:
PDF, 250 KB
english, 2004