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[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - Chemical-mechanical polishing aware application-specific 3D NoC design
Jang, Wooyoung, He, Ou, Yang, Jae-Seok, Pan, David Z.Year:
2011
Language:
english
DOI:
10.1109/iccad.2011.6105327
File:
PDF, 765 KB
english, 2011