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[IEEE 2010 IEEE International Reliability Physics Symposium - Garden Grove (Anaheim), CA, USA (2010.05.2-2010.05.6)] 2010 IEEE International Reliability Physics Symposium - Reliability constraints for TANOS memories due to alumina trapping and leakage
Amoroso, Salvatore M., Mauri, Aurelio, Galbiati, Nadia, Scozzari, Claudia, Mascellino, Evelyne, Camozzi, Elisa, Rangoni, Armando, Ghilardi, Tecla, Grossi, Alessandro, Tessariol, Paolo, Compagnoni, ChrYear:
2010
Language:
english
DOI:
10.1109/irps.2010.5488694
File:
PDF, 152 KB
english, 2010