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[IEEE 2012 IEEE Faible Tension Faible Consommation (FTFC) - Paris, France (2012.06.6-2012.06.8)] 2012 IEEE Faible Tension Faible Consommation - Ultra low-voltage and high speed dynamic and static CMOS precharge logic
Berg, Y., Mirmotahari, O.Year:
2012
Language:
english
DOI:
10.1109/ftfc.2012.6231718
File:
PDF, 1010 KB
english, 2012