Development of a High-Resolution Muon Tracking System Based on Micropattern Detectors
Bortfeldt, Jonathan, Biebel, Otmar, Heereman, David, Hertenberger, RalfVolume:
59
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2012.2202688
Date:
August, 2012
File:
PDF, 1.27 MB
english, 2012