[IEEE 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Hsinchu, Taiwan (2007.04.23-2007.04.25)] 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA) - Managing Bias-Temperature Instability for Product Reliability
Lee, Yung-Huei, McMahon, William, Mielke, Neal, Lu, Yin-Lung Ryan, Walstra, SteveYear:
2007
Language:
english
DOI:
10.1109/vtsa.2007.378916
File:
PDF, 1.15 MB
english, 2007